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Title: IREM infrared emission microscopes for semiconductor failure analysis, fault isolation, and debugging - IRLabs Main
Description: IRLabs is the world leader in infrared low-light-level imaging. We designed the first Infrared Emission Microscope in 1996. Our current generation IREM-SIL is the world’s most sensitive InGaAs-based IREM-SIL used for semiconductor fault analysis, fault